- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 9/02017 - Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
Patent holdings for IPC class G01B 9/02017
Total number of patents in this class: 41
10-year publication summary
0
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0
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1
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2
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0
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3
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8
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8
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11
|
6
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
KLA Corporation | 1223 |
2 |
VDL Enabling Technologies Group B.V. | 14 |
2 |
Qunnect Inc. | 15 |
2 |
META Platforms Technologies, LLC | 4806 |
2 |
Apple Inc. | 50209 |
1 |
Hitachi, Ltd. | 16452 |
1 |
Mitsubishi Electric Corporation | 43934 |
1 |
Corning Incorporated | 9932 |
1 |
ASML Netherlands B.V. | 6816 |
1 |
Omron Corporation | 6968 |
1 |
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. | 4569 |
1 |
Carl Zeiss SMT GmbH | 2646 |
1 |
AMO Development, LLC | 691 |
1 |
AOSense, Inc. | 29 |
1 |
Associated Universities, Inc. | 45 |
1 |
Dscg Solutions, Inc. | 33 |
1 |
Egis Technology Inc. | 146 |
1 |
Heidelberg Engineering GmbH | 50 |
1 |
IDOM, S.A.U, a legal entity | 15 |
1 |
Institut National de La Recherche Scientifique | 246 |
1 |
Other owners | 17 |